Advanced optical quality assurance of silicon micro-strip sensors for the CBM Silicon Tracking System

dc.contributor.author	Lavrik, Evgeny
dc.date.accessioned	2020-04-27T08:32:40Z
dc.date.available	2020-04-27T08:32:40Z
dc.date.issued	2019
dc.identifier.issn	1872-9576
dc.identifier.uri	http://hdl.handle.net/10900/99851
dc.language.iso	en	en
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.nima.2018.09.131	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	530	de_DE
dc.title	Advanced optical quality assurance of silicon micro-strip sensors for the CBM Silicon Tracking System	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190926111821_00201
utue.publikation.seiten	640-641	de_DE
utue.personen.roh	Lavrik, E.
dcterms.isPartOf.ZSTitelID	Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment	de_DE
dcterms.isPartOf.ZS-Volume	936	de_DE