Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces

dc.contributor.author	Stiedl, Jan
dc.contributor.author	Chassé, Thomas
dc.date.accessioned	2020-02-05T15:36:45Z
dc.date.available	2020-02-05T15:36:45Z
dc.date.issued	2019
dc.identifier.issn	1873-5584
dc.identifier.uri	http://hdl.handle.net/10900/97656
dc.language.iso	en	de_DE
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.apsusc.2019.05.028	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190926111821_00166
utue.publikation.seiten	354-361	de_DE
utue.personen.roh	Stiedl, Jan
utue.personen.roh	Green, Simon
utue.personen.roh	Chasse, Thomas
utue.personen.roh	Rebner, Karsten
dcterms.isPartOf.ZSTitelID	Applied Surface Science	de_DE
dcterms.isPartOf.ZS-Volume	486	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE