Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces

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Auger electron spectroscopy and UV-Vis spectroscopy in combination with multivariate curve resolution analysis to determine the Cu2O/CuO ratios in oxide layers on technical copper surfaces

Author: Stiedl, Jan; Green, Simon; Chasse, Thomas; Rebner, Karsten
Tübinger Autor(en):
Stiedl, Jan
Chassé, Thomas
Published in: Applied Surface Science (2019), Bd. 486, S. 354-361
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.apsusc.2019.05.028
ISSN: 1873-5584
DDC Classifikation: 530 - Physics
540 - Chemistry and allied sciences
600 - Technology
Dokumentart: Article
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