PbSe mid-IR photoconductive thin films (part-II): Structural analysis of the functional layer

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dc.contributor.author Kumar, Praveen
dc.contributor.author Pfeffer, Michael Ulrich
dc.contributor.author Berthold, Christoph
dc.contributor.author Eibl, Oliver
dc.date.accessioned 2019-12-27T14:24:33Z
dc.date.available 2019-12-27T14:24:33Z
dc.date.issued 2018
dc.identifier.issn 1873-4669
dc.identifier.uri http://hdl.handle.net/10900/96749
dc.language.iso en en
dc.publisher Elsevier Science Sa de_DE
dc.relation.uri http://dx.doi.org/10.1016/j.jallcom.2017.11.252
dc.subject.ddc 540 de_DE
dc.subject.ddc 600 de_DE
dc.title PbSe mid-IR photoconductive thin films (part-II): Structural analysis of the functional layer de_DE
dc.type Artikel de_DE
utue.quellen.id 20190321153956_03630
utue.publikation.seiten 1654-1661 de_DE
utue.personen.roh Kumar, Praveen
utue.personen.roh Pfeffer, Michael
utue.personen.roh Berthold, Christoph
utue.personen.roh Eibl, Oliver
dcterms.isPartOf.ZSTitelID Journal of Alloys and Compounds de_DE
dcterms.isPartOf.ZS-Volume 735 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät


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