PbSe mid-IR photoconductive thin films (part-II): Structural analysis of the functional layer

dc.contributor.author	Kumar, Praveen
dc.contributor.author	Pfeffer, Michael Ulrich
dc.contributor.author	Berthold, Christoph
dc.contributor.author	Eibl, Oliver
dc.date.accessioned	2019-12-27T14:24:33Z
dc.date.available	2019-12-27T14:24:33Z
dc.date.issued	2018
dc.identifier.issn	1873-4669
dc.identifier.uri	http://hdl.handle.net/10900/96749
dc.language.iso	en	en
dc.publisher	Elsevier Science Sa	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.jallcom.2017.11.252
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	PbSe mid-IR photoconductive thin films (part-II): Structural analysis of the functional layer	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190321153956_03630
utue.publikation.seiten	1654-1661	de_DE
utue.personen.roh	Kumar, Praveen
utue.personen.roh	Pfeffer, Michael
utue.personen.roh	Berthold, Christoph
utue.personen.roh	Eibl, Oliver
dcterms.isPartOf.ZSTitelID	Journal of Alloys and Compounds	de_DE
dcterms.isPartOf.ZS-Volume	735	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät