Macro-SICM : A Scanning Ion Conductance Microscope for Large-Range Imaging

dc.contributor.author	Schierbaum, Nicolas
dc.contributor.author	Hack, Martin
dc.contributor.author	Betz, Oliver
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2019-11-18T07:50:12Z
dc.date.available	2019-11-18T07:50:12Z
dc.date.issued	2018
dc.identifier.issn	1520-6882
dc.identifier.uri	http://hdl.handle.net/10900/94885
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.analchem.7b04764	de_DE
dc.subject.ddc	540	de_DE
dc.title	Macro-SICM : A Scanning Ion Conductance Microscope for Large-Range Imaging	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190321153956_02949
utue.publikation.seiten	5048-5054	de_DE
utue.personen.roh	Schierbaum, Nicolas
utue.personen.roh	Hack, Martin
utue.personen.roh	Betz, Oliver
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Analytical Chemistry	de_DE
dcterms.isPartOf.ZS-Issue	8	de_DE
dcterms.isPartOf.ZS-Volume	90	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE