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| dc.contributor.author | Guénon, Stefan | |
| dc.date.accessioned | 2019-06-12T12:09:39Z | |
| dc.date.available | 2019-06-12T12:09:39Z | |
| dc.date.issued | 2018 | |
| dc.identifier.issn | 2469-9969 | |
| dc.identifier.uri | http://hdl.handle.net/10900/89558 | |
| dc.language.iso | en | de_DE |
| dc.publisher | Amer Physical Soc | de_DE |
| dc.relation.uri | http://dx.doi.org/10.1103/PhysRevB.98.195144 | de_DE |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.subject.ddc | 530 | de_DE |
| dc.subject.ddc | 600 | de_DE |
| dc.title | Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic | de_DE |
| dc.type | Article | de_DE |
| utue.quellen.id | 20190321153956_00371 | |
| utue.personen.roh | Valmianski, I | |
| utue.personen.roh | Wang, P. Y. | |
| utue.personen.roh | Wang, S. | |
| utue.personen.roh | Gabriel Ramirez, Juan | |
| utue.personen.roh | Guenon, S. | |
| utue.personen.roh | Schuller, Ivan K. | |
| dcterms.isPartOf.ZSTitelID | Physical Review B | de_DE |
| dcterms.isPartOf.ZS-Issue | Article 195144 | de_DE |
| dcterms.isPartOf.ZS-Volume | 98 | de_DE |
| utue.fakultaet | 07 Mathematisch-Naturwissenschaftliche Fakultät | de_DE |
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