Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic

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Origin of the current-driven breakdown in vanadium oxides: Thermal versus electronic

Author: Valmianski, I; Wang, P. Y.; Wang, S.; Gabriel Ramirez, Juan; Guenon, S.; Schuller, Ivan K.
Tübinger Autor(en):
Guenon, Stefan
Published in: Physical Review B (2018), Bd. 98, Article 195144
Verlagsangabe: Amer Physical Soc
Language: English
Full text: http://dx.doi.org/10.1103/PhysRevB.98.195144
ISSN: 2469-9969
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
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