An Accurate Model for the Ion Current-Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip-Sample Distance

dc.contributor.author	Rheinlaender, Johannes
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2019-04-09T07:59:42Z
dc.date.available	2019-04-09T07:59:42Z
dc.date.issued	2017
dc.identifier.issn	1520-6882
dc.identifier.uri	http://hdl.handle.net/10900/87606
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.analchem.7b03871	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	540	de_DE
dc.title	An Accurate Model for the Ion Current-Distance Behavior in Scanning Ion Conductance Microscopy Allows for Calibration of Pipet Tip Geometry and Tip-Sample Distance	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190131163842_00440
utue.publikation.seiten	11875-11880	de_DE
utue.personen.roh	Rheinlaender, Johannes
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Analytical Chemistry	de_DE
dcterms.isPartOf.ZS-Issue	21	de_DE
dcterms.isPartOf.ZS-Volume	89	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE