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| dc.contributor.author | Santini, Thiago | |
| dc.date.accessioned | 2019-01-07T15:45:24Z | |
| dc.date.available | 2019-01-07T15:45:24Z | |
| dc.date.issued | 2016 | |
| dc.identifier.issn | 1558-1578 | |
| dc.identifier.uri | http://hdl.handle.net/10900/85474 | |
| dc.language.iso | en | en |
| dc.publisher | IEEE - Inst Electrical Electronics Engineers Inc | de_DE |
| dc.relation.uri | http://dx.doi.org/10.1109/TNS.2015.2513384 | |
| dc.rights | info:eu-repo/semantics/closedAccess | |
| dc.subject.ddc | 600 | de_DE |
| dc.subject.ddc | 530 | de_DE |
| dc.title | Reliability Analysis of Operating Systems and Software Stack for Embedded Systems | de_DE |
| dc.type | Article | de_DE |
| dc.type | ConferenceObject | de_DE |
| utue.quellen.id | 20180405102126_01809 | |
| utue.publikation.seiten | 2225-2232 | de_DE |
| utue.personen.roh | Santini, Thiago | |
| utue.personen.roh | Carro, Luigi | |
| utue.personen.roh | Wagner, Flavio Rech | |
| utue.personen.roh | Rech, Paolo | |
| dcterms.isPartOf.ZSTitelID | IEEE Transactions on Nuclear Science | de_DE |
| dcterms.isPartOf.ZS-Issue | 4 | de_DE |
| dcterms.isPartOf.ZS-Volume | 63 | de_DE |
| utue.fakultaet | 07 Mathematisch-Naturwissenschaftliche Fakultät |
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