Reliability Analysis of Operating Systems and Software Stack for Embedded Systems

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Reliability Analysis of Operating Systems and Software Stack for Embedded Systems

Author: Santini, Thiago; Carro, Luigi; Wagner, Flavio Rech; Rech, Paolo
Tübinger Autor(en):
Santini, Thiago
Published in: IEEE Transactions on Nuclear Science (2016), Bd. 63, H. 4, S. 2225-2232
Verlagsangabe: IEEE - Inst Electrical Electronics Engineers Inc
Language: English
Full text: http://dx.doi.org/10.1109/TNS.2015.2513384
ISSN: 1558-1578
DDC Classifikation: 600 - Technology
530 - Physics
Dokumentart: Artikel
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