Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

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dc.contributor.author Kumar, Praveen
dc.contributor.author Pfeffer, Michael Ulrich
dc.contributor.author Willsch, Benjamin
dc.contributor.author Eibl, Oliver
dc.date.accessioned 2018-06-14T12:12:13Z
dc.date.available 2018-06-14T12:12:13Z
dc.date.issued 2017
dc.identifier.issn 1879-3398
dc.identifier.uri http://hdl.handle.net/10900/82742
dc.language.iso en en
dc.publisher Elsevier Science Bv de_DE
dc.relation.uri http://dx.doi.org/10.1016/j.solmat.2016.11.004
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 540 de_DE
dc.subject.ddc 600 de_DE
dc.subject.ddc 530 de_DE
dc.title Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS de_DE
dc.type Artikel de_DE
utue.quellen.id 20170815222223_02007
utue.publikation.seiten 398-409 de_DE
utue.personen.roh Kumar, Praveen
utue.personen.roh Pfeffer, Michael
utue.personen.roh Willsch, Benjamin
utue.personen.roh Eibl, Oliver
utue.personen.roh Yedra, Lluis
utue.personen.roh Eswara, Santhana
utue.personen.roh Audinot, Jean-Nicolas
utue.personen.roh Wirtz, Tom
dcterms.isPartOf.ZSTitelID Solar Energy Materials and Solar Cells de_DE
dcterms.isPartOf.ZS-Volume 160 de_DE
utue.fakultaet 04 Medizinische Fakultät


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