Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

dc.contributor.author	Kumar, Praveen
dc.contributor.author	Pfeffer, Michael Ulrich
dc.contributor.author	Willsch, Benjamin
dc.contributor.author	Eibl, Oliver
dc.date.accessioned	2018-06-14T12:12:13Z
dc.date.available	2018-06-14T12:12:13Z
dc.date.issued	2017
dc.identifier.issn	1879-3398
dc.identifier.uri	http://hdl.handle.net/10900/82742
dc.language.iso	en	en
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.solmat.2016.11.004
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	530	de_DE
dc.title	Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS	de_DE
dc.type	Article	de_DE
utue.quellen.id	20170815222223_02007
utue.publikation.seiten	398-409	de_DE
utue.personen.roh	Kumar, Praveen
utue.personen.roh	Pfeffer, Michael
utue.personen.roh	Willsch, Benjamin
utue.personen.roh	Eibl, Oliver
utue.personen.roh	Yedra, Lluis
utue.personen.roh	Eswara, Santhana
utue.personen.roh	Audinot, Jean-Nicolas
utue.personen.roh	Wirtz, Tom
dcterms.isPartOf.ZSTitelID	Solar Energy Materials and Solar Cells	de_DE
dcterms.isPartOf.ZS-Volume	160	de_DE
utue.fakultaet	04 Medizinische Fakultät