Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

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Direct imaging of dopant distributions across the Si-metallization interfaces in solar cells: Correlative nano-analytics by electron microscopy and NanoSIMS

Author: Kumar, Praveen; Pfeffer, Michael; Willsch, Benjamin; Eibl, Oliver; Yedra, Lluis; Eswara, Santhana; Audinot, Jean-Nicolas; Wirtz, Tom
Tübinger Autor(en):
Kumar, Praveen
Pfeffer, Michael
Willsch, Benjamin
Eibl, Oliver
Published in: Solar Energy Materials and Solar Cells (2017), Bd. 160, S. 398-409
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.solmat.2016.11.004
ISSN: 1879-3398
DDC Classifikation: 540 - Chemistry and allied sciences
600 - Technology
530 - Physics
Dokumentart: Artikel
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