Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging

dc.contributor.author	Seifert, Jan
dc.contributor.author	Rheinlaender, Johannes
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2015-11-02T15:47:19Z
dc.date.available	2015-11-02T15:47:19Z
dc.date.issued	2015
dc.identifier.issn	0743-7463
dc.identifier.uri	http://hdl.handle.net/10900/66077
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.langmuir.5b01124	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	Comparison of Atomic Force Microscopy and Scanning Ion Conductance Microscopy for Live Cell Imaging	de_DE
dc.type	Article	de_DE
utue.quellen.id	20150901145020_00329
utue.publikation.seiten	6807-6813	de_DE
utue.personen.roh	Seifert, Jan
utue.personen.roh	Rheinlaender, Johannes
utue.personen.roh	Novak, Pavel
utue.personen.roh	Korchev, Yuri E.
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Langmuir	de_DE
dcterms.isPartOf.ZS-Issue	24	de_DE
dcterms.isPartOf.ZS-Volume	31	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE