Cold-atom scanning probe microscopy

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dc.contributor.author Gierling, Michael
dc.contributor.author Schneeweiß, Philipp
dc.contributor.author Visanescu, Gabriela
dc.contributor.author Federsel, Klaus Peter
dc.contributor.author Häffner, Michael
dc.contributor.author Kern, Dieter P.
dc.contributor.author Judd, Thomas E.
dc.contributor.author Günther, Andreas
dc.contributor.author Fortágh, József
dc.date.accessioned 2015-03-30T16:33:40Z
dc.date.available 2015-03-30T16:33:40Z
dc.date.issued 2011
dc.identifier.issn 1748-3387
dc.identifier.uri http://hdl.handle.net/10900/62448
dc.language.iso en de_DE
dc.publisher London, New York : npg de_DE
dc.relation.uri http://dx.doi.org/10.1038/nnano.2011.80 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 530 de_DE
dc.title Cold-atom scanning probe microscopy de_DE
dc.type Article de_DE
utue.publikation.seiten 446-451 de_DE
utue.personen.roh Gierling, Michael
utue.personen.roh Schneeweiss, Philipp
utue.personen.roh Visanescu, Gabriela
utue.personen.roh Federsel, Peter
utue.personen.roh Häffner, Michael
utue.personen.roh Kern, Dieter P.
utue.personen.roh Judd, Thomas E.
utue.personen.roh Günther, Andreas
utue.personen.roh Fortágh, József
dcterms.isPartOf.ZSTitelID Nature Nanotechnology de_DE
dcterms.isPartOf.ZS-Volume 6 de_DE


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