Cold-atom scanning probe microscopy

dc.contributor.author	Gierling, Michael
dc.contributor.author	Schneeweiß, Philipp
dc.contributor.author	Visanescu, Gabriela
dc.contributor.author	Federsel, Klaus Peter
dc.contributor.author	Häffner, Michael
dc.contributor.author	Kern, Dieter P.
dc.contributor.author	Judd, Thomas E.
dc.contributor.author	Günther, Andreas
dc.contributor.author	Fortágh, József
dc.date.accessioned	2015-03-30T16:33:40Z
dc.date.available	2015-03-30T16:33:40Z
dc.date.issued	2011
dc.identifier.issn	1748-3387
dc.identifier.uri	http://hdl.handle.net/10900/62448
dc.language.iso	en	de_DE
dc.publisher	London, New York : npg	de_DE
dc.relation.uri	http://dx.doi.org/10.1038/nnano.2011.80	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.title	Cold-atom scanning probe microscopy	de_DE
dc.type	Article	de_DE
utue.publikation.seiten	446-451	de_DE
utue.personen.roh	Gierling, Michael
utue.personen.roh	Schneeweiss, Philipp
utue.personen.roh	Visanescu, Gabriela
utue.personen.roh	Federsel, Peter
utue.personen.roh	Häffner, Michael
utue.personen.roh	Kern, Dieter P.
utue.personen.roh	Judd, Thomas E.
utue.personen.roh	Günther, Andreas
utue.personen.roh	Fortágh, József
dcterms.isPartOf.ZSTitelID	Nature Nanotechnology	de_DE
dcterms.isPartOf.ZS-Volume	6	de_DE

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