Cold-atom scanning probe microscopy

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Cold-atom scanning probe microscopy

Author: Gierling, Michael; Schneeweiss, Philipp; Visanescu, Gabriela; Federsel, Peter; Häffner, Michael; Kern, Dieter P.; Judd, Thomas E.; Günther, Andreas; Fortágh, József
Tübinger Autor(en):
Gierling, Michael
Schneeweiss, Philipp
Visanescu, Gabriela
Federsel, Klaus Peter
Häffner, Michael
Kern, Dieter P.
Judd, Thomas E.
Günther, Andreas
Fortágh, József
Published in: Nature Nanotechnology (2011), Bd. 6, S. 446-451
Verlagsangabe: London, New York : npg
Language: English
Full text: http://dx.doi.org/10.1038/nnano.2011.80
ISSN: 1748-3387
DDC Classifikation: 530 - Physics
Dokumentart: Artikel
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