Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience

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Resilience Articulation Point (RAP): Cross-layer dependability modeling for nanometer system-on-chip resilience

Author: Herkersdorf, Andreas; Aliee, Hananeh; Engel, Michael; Glass, Michael; Gimmler-Dumont, Christina; Henkel, Joerg; Kleeberger, Veit B.; Kochte, Michael A.; Kuehn, Johannes M.; Mueller-Gritschneder, Daniel; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Juergen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim
Tübinger Autor(en):
Rosenstiel, Wolfgang
Kühn, Johannes Maximilian
Published in: Microelectronics Reliability (2014), Bd. 54, H. 6-7, S. 1066-1074
Verlagsangabe: Pergamon - Elsevier Science Ltd
Language: English
Full text: http://dx.doi.org/10.1016/j.microrel.2013.12.012
ISSN: 0026-2714
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Article
ConferenceObject
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