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| Author: | Herkersdorf, Andreas; Aliee, Hananeh; Engel, Michael; Glass, Michael; Gimmler-Dumont, Christina; Henkel, Joerg; Kleeberger, Veit B.; Kochte, Michael A.; Kuehn, Johannes M.; Mueller-Gritschneder, Daniel; Nassif, Sani R.; Rauchfuss, Holm; Rosenstiel, Wolfgang; Schlichtmann, Ulf; Shafique, Muhammad; Tahoori, Mehdi B.; Teich, Juergen; Wehn, Norbert; Weis, Christian; Wunderlich, Hans-Joachim | |
| Tübinger Autor(en): |
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| Published in: |
Microelectronics Reliability
(2014), Bd.
54,
H.
6-7,
S.
1066-1074 |
|
| Verlagsangabe: | Pergamon - Elsevier Science Ltd | |
| Language: | English | |
| Full text: | http://dx.doi.org/10.1016/j.microrel.2013.12.012 | |
| ISSN: | 0026-2714 | |
| DDC Classifikation: |
530 - Physics 600 - Technology |
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| Dokumentart: |
Article ConferenceObject |
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