Note: Artificial neural networks for the automated analysis of force map data in atomic force microscopy

dc.contributor.author	Braunsmann, Christoph
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2014-09-15T08:58:14Z
dc.date.available	2014-09-15T08:58:14Z
dc.date.issued	2014
dc.identifier.issn	0034-6748
dc.identifier.uri	http://hdl.handle.net/10900/56197
dc.language.iso	en	de_DE
dc.publisher	Amer Inst Physics	de_DE
dc.relation.uri	http://dx.doi.org/10.1063/1.4876485	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Note: Artificial neural networks for the automated analysis of force map data in atomic force microscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140813180100_00565	de_DE
utue.personen.roh	Braunsmann, Christoph
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Review of Scientific Instruments	de_DE
dcterms.isPartOf.ZS-Issue	Article 056104	de_DE
dcterms.isPartOf.ZS-Volume	85	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE