Note: Artificial neural networks for the automated analysis of force map data in atomic force microscopy

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Note: Artificial neural networks for the automated analysis of force map data in atomic force microscopy

Author: Braunsmann, Christoph; Schaeffer, Tilman E.
Tübinger Autor(en):
Braunsmann, Christoph
Schäffer, Tilman
Published in: Review of Scientific Instruments (2014), Bd. 85, Article 056104
Verlagsangabe: Amer Inst Physics
Language: English
Full text: http://dx.doi.org/10.1063/1.4876485
ISSN: 0034-6748
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Article
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