Creep compliance mapping by atomic force microscopy

dc.contributor.author	Braunsmann, Christoph
dc.contributor.author	Schäffer, Tilman
dc.date.accessioned	2014-07-14T14:49:41Z
dc.date.available	2014-07-14T14:49:41Z
dc.date.issued	2014
dc.identifier.issn	0032-3861
dc.identifier.uri	http://hdl.handle.net/10900/54354
dc.language.iso	en	de_DE
dc.publisher	Elsevier Sci Ltd	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.polymer.2013.11.029	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	Creep compliance mapping by atomic force microscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140610213910_00978	de_DE
utue.publikation.seiten	219-225	de_DE
utue.personen.roh	Braunsmann, Christoph
utue.personen.roh	Proksch, Roger
utue.personen.roh	Revenko, Irene
utue.personen.roh	Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID	Polymer	de_DE
dcterms.isPartOf.ZS-Issue	1	de_DE
dcterms.isPartOf.ZS-Volume	55	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE