Creep compliance mapping by atomic force microscopy

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Creep compliance mapping by atomic force microscopy

Author: Braunsmann, Christoph; Proksch, Roger; Revenko, Irene; Schaeffer, Tilman E.
Tübinger Autor(en):
Braunsmann, Christoph
Schäffer, Tilman
Published in: Polymer (2014), Bd. 55, H. 1, S. 219-225
Verlagsangabe: Elsevier Sci Ltd
Language: English
Full text: http://dx.doi.org/10.1016/j.polymer.2013.11.029
ISSN: 0032-3861
DDC Classifikation: 530 - Physics
540 - Chemistry and allied sciences
Dokumentart: Artikel
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