Biprism electron interferometry with a single atom tip source

dc.contributor.author	Schütz, Georg
dc.contributor.author	Rembold, Alexander
dc.contributor.author	Pooch, Andreas
dc.contributor.author	Meier, Simon
dc.contributor.author	Günther, Andreas
dc.contributor.author	Stibor, Alexander
dc.date.accessioned	2014-07-03T15:17:44Z
dc.date.available	2014-07-03T15:17:44Z
dc.date.issued	2014
dc.identifier.issn	0304-3991
dc.identifier.uri	http://hdl.handle.net/10900/54032
dc.language.iso	en	de_DE
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.ultramic.2014.02.003	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	570	de_DE
dc.subject.ddc	600	de_DE
dc.title	Biprism electron interferometry with a single atom tip source	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140610213910_00011	de_DE
utue.publikation.seiten	9-15	de_DE
utue.personen.roh	Schuetz, G.
utue.personen.roh	Rembold, A.
utue.personen.roh	Pooch, A.
utue.personen.roh	Meier, S.
utue.personen.roh	Schneeweiss, P.
utue.personen.roh	Rauschenbeutel, A.
utue.personen.roh	Guenther, A.
utue.personen.roh	Chang, W. T.
utue.personen.roh	Hwang, I. S.
utue.personen.roh	Stibor, A.
dcterms.isPartOf.ZSTitelID	Ultramicroscopy	de_DE
dcterms.isPartOf.ZS-Volume	141	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE