Photoemission study of the Si(111)-native SiO2/copper phthalocyanine (CuPc) ultra-thin film interface

dc.contributor.author	Peisert, Heiko
dc.contributor.author	Chassé, Thomas
dc.date.accessioned	2014-03-06T16:45:09Z
dc.date.available	2014-03-06T16:45:09Z
dc.date.issued	2012
dc.identifier.issn	1566-1199
dc.identifier.uri	http://hdl.handle.net/10900/43070
dc.language.iso	en	de_DE
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.orgel.2012.05.035	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Photoemission study of the Si(111)-native SiO2/copper phthalocyanine (CuPc) ultra-thin film interface	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140226071329_00861	de_DE
utue.publikation.seiten	1873-1880	de_DE
utue.personen.roh	Grzadziel, L.
utue.personen.roh	Krzywiecki, M.
utue.personen.roh	Peisert, H.
utue.personen.roh	Chasse, T.
utue.personen.roh	Szuber, J.
dcterms.isPartOf.ZSTitelID	Organic Electronics	de_DE
dcterms.isPartOf.ZS-Issue	10	de_DE
dcterms.isPartOf.ZS-Volume	13	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE