Photoemission study of the Si(111)-native SiO2/copper phthalocyanine (CuPc) ultra-thin film interface

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Photoemission study of the Si(111)-native SiO2/copper phthalocyanine (CuPc) ultra-thin film interface

Author: Grzadziel, L.; Krzywiecki, M.; Peisert, H.; Chasse, T.; Szuber, J.
Tübinger Autor(en):
Peisert, Heiko
Chassé, Thomas
Published in: Organic Electronics (2012), Bd. 13, H. 10, S. 1873-1880
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.orgel.2012.05.035
ISSN: 1566-1199
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
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