In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere

dc.contributor.author	Schreiber, Frank
dc.contributor.author	Gerlach, Alexander
dc.contributor.author	Lorch, Christopher
dc.contributor.author	Hinderhofer, Alexander
dc.date.accessioned	2014-03-05T15:38:33Z
dc.date.available	2014-03-05T15:38:33Z
dc.date.issued	2012
dc.identifier.issn	0009-2614
dc.identifier.uri	http://hdl.handle.net/10900/42892
dc.language.iso	en	de_DE
dc.publisher	Elsevier Science Bv	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.cplett.2012.07.006	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere	de_DE
dc.type	Article	de_DE
utue.quellen.id	20140226071329_01403	de_DE
utue.publikation.seiten	34-38	de_DE
utue.personen.roh	Hosokai, T.
utue.personen.roh	Hinderhofer, A.
utue.personen.roh	Vorobiev, A.
utue.personen.roh	Lorch, C.
utue.personen.roh	Watanabe, T.
utue.personen.roh	Koganezawa, T.
utue.personen.roh	Gerlach, A.
utue.personen.roh	Yoshimoto, N.
utue.personen.roh	Kubozono, Y.
utue.personen.roh	Schreiber, F.
dcterms.isPartOf.ZSTitelID	Chemical Physics Letters	de_DE
dcterms.isPartOf.ZS-Volume	544	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE