In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere

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dc.contributor.author Schreiber, Frank
dc.contributor.author Gerlach, Alexander
dc.contributor.author Lorch, Christopher
dc.contributor.author Hinderhofer, Alexander
dc.date.accessioned 2014-03-05T15:38:33Z
dc.date.available 2014-03-05T15:38:33Z
dc.date.issued 2012
dc.identifier.issn 0009-2614
dc.identifier.uri http://hdl.handle.net/10900/42892
dc.language.iso en de_DE
dc.publisher Elsevier Science Bv de_DE
dc.relation.uri http://dx.doi.org/10.1016/j.cplett.2012.07.006 de_DE
dc.rights info:eu-repo/semantics/closedAccess
dc.subject.ddc 530 de_DE
dc.subject.ddc 540 de_DE
dc.title In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere de_DE
dc.type Artikel de_DE
utue.quellen.id 20140226071329_01403 de_DE
utue.publikation.seiten 34-38 de_DE
utue.personen.roh Hosokai, T.
utue.personen.roh Hinderhofer, A.
utue.personen.roh Vorobiev, A.
utue.personen.roh Lorch, C.
utue.personen.roh Watanabe, T.
utue.personen.roh Koganezawa, T.
utue.personen.roh Gerlach, A.
utue.personen.roh Yoshimoto, N.
utue.personen.roh Kubozono, Y.
utue.personen.roh Schreiber, F.
dcterms.isPartOf.ZSTitelID Chemical Physics Letters de_DE
dcterms.isPartOf.ZS-Volume 544 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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