In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere

DSpace Repository

In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere

Author: Hosokai, T.; Hinderhofer, A.; Vorobiev, A.; Lorch, C.; Watanabe, T.; Koganezawa, T.; Gerlach, A.; Yoshimoto, N.; Kubozono, Y.; Schreiber, F.
Tübinger Autor(en):
Schreiber, Frank
Gerlach, Alexander
Lorch, Christopher
Hinderhofer, Alexander
Published in: Chemical Physics Letters (2012), Bd. 544, S. 34-38
Verlagsangabe: Elsevier Science Bv
Language: English
Full text: http://dx.doi.org/10.1016/j.cplett.2012.07.006
ISSN: 0009-2614
DDC Classifikation: 530 - Physics
540 - Chemistry and allied sciences
Dokumentart: Artikel
Show full item record

This item appears in the following Collection(s)