In situ structural characterization of picene thin films by X-ray scattering: Vacuum versus O-2 atmosphere

Author:

Hosokai, T.; Hinderhofer, A.; Vorobiev, A.; Lorch, C.; Watanabe, T.; Koganezawa, T.; Gerlach, A.; Yoshimoto, N.; Kubozono, Y.; Schreiber, F.

Tübinger Autor(en):

Published in:

Chemical Physics Letters (2012), Bd. 544, S. 34-38

Verlagsangabe:

Elsevier Science Bv

Language:

English

Full text:

ISSN:

0009-2614

DDC Classifikation:

530 - Physics
540 - Chemistry and allied sciences

Dokumentart:

Article

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