Resolution and sensitivity of wafer-level multi-aperture cameras

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Resolution and sensitivity of wafer-level multi-aperture cameras

Author: Oberdoerster, Alexander; Lensch, Hendrik P. A.
Tübinger Autor(en):
Lensch, Hendrik P. A.
Published in: Journal of Electronic Imaging (2013), Bd. 22, Article 011001
Verlagsangabe: Is&t & Spie
Language: English
Full text: http://dx.doi.org/10.1117/1.JEI.22.1.011001
ISSN: 1017-9909
DDC Classifikation: 600 - Technology
530 - Physics
610 - Medicine and health
Dokumentart: Artikel
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