dc.contributor.author |
Werner, Robert |
|
dc.contributor.author |
Kemmler, Matthias |
|
dc.contributor.author |
Kölle, Dieter |
|
dc.contributor.author |
Kleiner, Reinhold |
|
dc.contributor.author |
Bothner, Daniel |
|
dc.date.accessioned |
2013-10-29T08:59:47Z |
|
dc.date.available |
2013-10-29T08:59:47Z |
|
dc.date.issued |
2013 |
|
dc.identifier.issn |
0953-2048 |
|
dc.identifier.uri |
http://hdl.handle.net/10900/37423 |
|
dc.language.iso |
en |
de_DE |
dc.publisher |
Iop Publishing Ltd |
de_DE |
dc.relation.uri |
http://dx.doi.org/10.1088/0953-2048/26/9/095011 |
de_DE |
dc.rights |
info:eu-repo/semantics/closedAccess |
|
dc.subject.ddc |
530 |
de_DE |
dc.title |
Edge superconductivity in Nb thin film microbridges revealed by electric transport measurements and visualized by scanning laser microscopy |
de_DE |
dc.type |
Article |
de_DE |
utue.quellen.id |
20130911224530_00041 |
de_DE |
utue.personen.roh |
Werner, R. |
|
utue.personen.roh |
Aladyshkin, A. Yu |
|
utue.personen.roh |
Nefedov, I. M. |
|
utue.personen.roh |
Putilov, A. V. |
|
utue.personen.roh |
Kemmler, M. |
|
utue.personen.roh |
Bothner, D. |
|
utue.personen.roh |
Loerincz, A. |
|
utue.personen.roh |
Ilin, K. |
|
utue.personen.roh |
Siegel, M. |
|
utue.personen.roh |
Kleiner, R. |
|
utue.personen.roh |
Koelle, D. |
|
dcterms.isPartOf.ZSTitelID |
Superconductor Science & Technology |
de_DE |
dcterms.isPartOf.ZS-Issue |
Article 095011 |
de_DE |
dcterms.isPartOf.ZS-Volume |
26 |
de_DE |
utue.fakultaet |
07 Mathematisch-Naturwissenschaftliche Fakultät |
de_DE |