Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet

dc.contributor.author	Hein, Matthias
dc.contributor.author	Augustin, Maximilian
dc.date.accessioned	2023-09-07T07:53:07Z
dc.date.available	2023-09-07T07:53:07Z
dc.date.issued	2023-08-22
dc.identifier.uri	http://hdl.handle.net/10900/145317
dc.language.iso	en	de_DE
dc.publisher	arXiv	de_DE
dc.relation.uri	https://doi.org/10.48550/arXiv.2212.04871	de_DE
dc.subject.ddc	004	de_DE
dc.title	Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet	de_DE
dc.type	Preprint	de_DE
utue.personen.roh	Hein, Matthias
utue.personen.roh	Boreiko, Valentyn
utue.personen.roh	Augustin, Maximilian
utue.personen.roh	Neuhaus, Yannic