Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet

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Spurious Features Everywhere - Large-Scale Detection of Harmful Spurious Features in ImageNet

Author: Hein, Matthias; Boreiko, Valentyn; Augustin, Maximilian; Neuhaus, Yannic
Tübinger Autor(en):
Hein, Matthias
Augustin, Maximilian
Issue year: 2023-08-22
Verlagsangabe: arXiv
Language: English
Full text: https://doi.org/10.48550/arXiv.2212.04871
DDC Classifikation: 004 - Data processing and computer science
Dokumentart: Preprint
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