Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence

dc.contributor.author	Schmidt, Hans Rudolf
dc.date.accessioned	2022-07-05T12:56:28Z
dc.date.available	2022-07-05T12:56:28Z
dc.date.issued	2022
dc.identifier.issn	0168-9002
dc.identifier.uri	http://hdl.handle.net/10900/129065
dc.language.iso	en	de_DE
dc.publisher	Amsterdam	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.nima.2021.165932	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence	de_DE
dc.type	Article	de_DE
utue.quellen.id	20220404000000_00800
utue.personen.roh	Lavrik, E.
utue.personen.roh	Shiroya, M.
utue.personen.roh	Schmidt, H. R.
utue.personen.roh	Toia, A.
utue.personen.roh	Heuser, J. M.
dcterms.isPartOf.ZSTitelID	Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment	de_DE
dcterms.isPartOf.ZS-Issue	Article 165932	de_DE
dcterms.isPartOf.ZS-Volume	1021	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE