Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence

DSpace Repository

Optical inspection of the silicon micro-strip sensors for the CBM experiment employing artificial intelligence

Author: Lavrik, E.; Shiroya, M.; Schmidt, H. R.; Toia, A.; Heuser, J. M.
Tübinger Autor(en):
Schmidt, Hans Rudolf
Published in: Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment (2022), Bd. 1021, Article 165932
Verlagsangabe: Amsterdam
Language: English
Full text: http://dx.doi.org/10.1016/j.nima.2021.165932
ISSN: 0168-9002
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
Show full item record

This item appears in the following Collection(s)