Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization

dc.contributor.author	Hodas, Martin
dc.contributor.author	Schreiber, Frank
dc.date.accessioned	2021-11-08T10:27:44Z
dc.date.available	2021-11-08T10:27:44Z
dc.date.issued	2021
dc.identifier.issn	1932-7455
dc.identifier.uri	http://hdl.handle.net/10900/120535
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.jpcc.1c01716	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210824232002_01259
utue.publikation.seiten	9461-9468	de_DE
utue.personen.roh	Shaji, Ashin
utue.personen.roh	Vegso, Karol
utue.personen.roh	Sojkova, Michaela
utue.personen.roh	Hulman, Martin
utue.personen.roh	Nadazdy, Peter
utue.personen.roh	Hutar, Peter
utue.personen.roh	Slusna, Lenka Pribusova
utue.personen.roh	Hrda, Jana
utue.personen.roh	Bodik, Michal
utue.personen.roh	Hodas, Martin
utue.personen.roh	Bernstorff, Sigrid
utue.personen.roh	Jergel, Matej
utue.personen.roh	Majkova, Eva
utue.personen.roh	Schreiber, Frank
utue.personen.roh	Siffalovic, Peter
dcterms.isPartOf.ZSTitelID	Journal of Physical Chemistry C	de_DE
dcterms.isPartOf.ZS-Issue	SI	de_DE
dcterms.isPartOf.ZS-Volume	125	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE