Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization

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Orientation of Few-Layer MoS2 Films: In-Situ X-ray Scattering Study During Sulfurization

Author: Shaji, Ashin; Vegso, Karol; Sojkova, Michaela; Hulman, Martin; Nadazdy, Peter; Hutar, Peter; Slusna, Lenka Pribusova; Hrda, Jana; Bodik, Michal; Hodas, Martin; Bernstorff, Sigrid; Jergel, Matej; Majkova, Eva; Schreiber, Frank; Siffalovic, Peter
Tübinger Autor(en):
Hodas, Martin
Schreiber, Frank
Published in: Journal of Physical Chemistry C (2021), Bd. 125, H. SI, S. 9461-9468
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acs.jpcc.1c01716
ISSN: 1932-7455
DDC Classifikation: 530 - Physics
540 - Chemistry and allied sciences
Dokumentart: Article
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