Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity

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dc.contributor.author Schreiber, Frank
dc.contributor.author Hinderhofer, Alexander
dc.contributor.author Gerlach, Alexander
dc.contributor.author Duva, Giuliano
dc.contributor.author Janik, Alexander
dc.date.accessioned 2021-07-27T12:19:30Z
dc.date.available 2021-07-27T12:19:30Z
dc.date.issued 2021
dc.identifier.issn 1361-648X
dc.identifier.uri http://hdl.handle.net/10900/117346
dc.language.iso en de_DE
dc.publisher Iop Publishing Ltd de_DE
dc.relation.uri http://dx.doi.org/10.1088/1361-648X/abd11c de_DE
dc.subject.ddc 530 de_DE
dc.title Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity de_DE
dc.type Article de_DE
utue.quellen.id 20210512015105_00378
utue.personen.roh Duva, G.
utue.personen.roh Pithan, L.
utue.personen.roh Gerlach, A.
utue.personen.roh Janik, A.
utue.personen.roh Hinderhofer, A.
utue.personen.roh Schreiber, F.
dcterms.isPartOf.ZSTitelID Journal of Physics - Condensed Matter de_DE
dcterms.isPartOf.ZS-Issue Article 115003 de_DE
dcterms.isPartOf.ZS-Volume 33 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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