Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity

dc.contributor.author	Schreiber, Frank
dc.contributor.author	Hinderhofer, Alexander
dc.contributor.author	Gerlach, Alexander
dc.contributor.author	Duva, Giuliano
dc.contributor.author	Janik, Alexander
dc.date.accessioned	2021-07-27T12:19:30Z
dc.date.available	2021-07-27T12:19:30Z
dc.date.issued	2021
dc.identifier.issn	1361-648X
dc.identifier.uri	http://hdl.handle.net/10900/117346
dc.language.iso	en	de_DE
dc.publisher	Iop Publishing Ltd	de_DE
dc.relation.uri	http://dx.doi.org/10.1088/1361-648X/abd11c	de_DE
dc.subject.ddc	530	de_DE
dc.title	Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210512015105_00378
utue.personen.roh	Duva, G.
utue.personen.roh	Pithan, L.
utue.personen.roh	Gerlach, A.
utue.personen.roh	Janik, A.
utue.personen.roh	Hinderhofer, A.
utue.personen.roh	Schreiber, F.
dcterms.isPartOf.ZSTitelID	Journal of Physics - Condensed Matter	de_DE
dcterms.isPartOf.ZS-Issue	Article 115003	de_DE
dcterms.isPartOf.ZS-Volume	33	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE