Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity

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Roughness evolution in strongly interacting donor:acceptor mixtures of molecular semiconductors. An in situ, real-time growth study using x-ray reflectivity

Author: Duva, G.; Pithan, L.; Gerlach, A.; Janik, A.; Hinderhofer, A.; Schreiber, F.
Tübinger Autor(en):
Schreiber, Frank
Hinderhofer, Alexander
Gerlach, Alexander
Duva, Giuliano
Janik, Alexander
Published in: Journal of Physics - Condensed Matter (2021), Bd. 33, Article 115003
Verlagsangabe: Iop Publishing Ltd
Language: English
Full text: http://dx.doi.org/10.1088/1361-648X/abd11c
ISSN: 1361-648X
DDC Classifikation: 530 - Physics
Dokumentart: Article
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