The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements

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dc.contributor.author Rheinlaender, Johannes
dc.contributor.author Schäffer, Tilman
dc.date.accessioned 2021-06-09T13:14:45Z
dc.date.available 2021-06-09T13:14:45Z
dc.date.issued 2020
dc.identifier.issn 1077-3118
dc.identifier.uri http://hdl.handle.net/10900/116121
dc.language.iso en de_DE
dc.publisher Amer Inst Physics de_DE
dc.relation.uri http://dx.doi.org/10.1063/5.0024863 de_DE
dc.subject.ddc 530 de_DE
dc.title The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements de_DE
dc.type Artikel de_DE
utue.quellen.id 20210304112512_01513
utue.personen.roh Rheinlaender, Johannes
utue.personen.roh Schaeffer, Tilman E.
dcterms.isPartOf.ZSTitelID Applied Physics Letters de_DE
dcterms.isPartOf.ZS-Issue Article 113701 de_DE
dcterms.isPartOf.ZS-Volume 117 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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