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| dc.contributor.author | Rheinlaender, Johannes | |
| dc.contributor.author | Schäffer, Tilman | |
| dc.date.accessioned | 2021-06-09T13:14:45Z | |
| dc.date.available | 2021-06-09T13:14:45Z | |
| dc.date.issued | 2020 | |
| dc.identifier.issn | 1077-3118 | |
| dc.identifier.uri | http://hdl.handle.net/10900/116121 | |
| dc.language.iso | en | de_DE |
| dc.publisher | Amer Inst Physics | de_DE |
| dc.relation.uri | http://dx.doi.org/10.1063/5.0024863 | de_DE |
| dc.subject.ddc | 530 | de_DE |
| dc.title | The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements | de_DE |
| dc.type | Article | de_DE |
| utue.quellen.id | 20210304112512_01513 | |
| utue.personen.roh | Rheinlaender, Johannes | |
| utue.personen.roh | Schaeffer, Tilman E. | |
| dcterms.isPartOf.ZSTitelID | Applied Physics Letters | de_DE |
| dcterms.isPartOf.ZS-Issue | Article 113701 | de_DE |
| dcterms.isPartOf.ZS-Volume | 117 | de_DE |
| utue.fakultaet | 07 Mathematisch-Naturwissenschaftliche Fakultät | de_DE |
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