The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements

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The effect of finite sample thickness in scanning ion conductance microscopy stiffness measurements

Author: Rheinlaender, Johannes; Schaeffer, Tilman E.
Tübinger Autor(en):
Rheinlaender, Johannes
Schäffer, Tilman
Published in: Applied Physics Letters (2020), Bd. 117, Article 113701
Verlagsangabe: Amer Inst Physics
Language: English
Full text: http://dx.doi.org/10.1063/5.0024863
ISSN: 1077-3118
DDC Classifikation: 530 - Physics
Dokumentart: Artikel
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