Perturbation-evoked potentials can be classified from single-trial EEG

dc.contributor.author	Ditz, Jonas C.
dc.date.accessioned	2021-02-08T08:14:20Z
dc.date.available	2021-02-08T08:14:20Z
dc.date.issued	2020
dc.identifier.issn	1741-2552
dc.identifier.uri	http://hdl.handle.net/10900/112444
dc.language.iso	en	de_DE
dc.publisher	Iop Publishing Ltd	de_DE
dc.relation.uri	http://dx.doi.org/10.1088/1741-2552/ab89fb	de_DE
dc.subject.ddc	570	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	610	de_DE
dc.title	Perturbation-evoked potentials can be classified from single-trial EEG	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200715072417_00266
utue.personen.roh	Ditz, Jonas C.
utue.personen.roh	Schwarz, Andreas
utue.personen.roh	Mueller-Putz, Gernot R.
dcterms.isPartOf.ZSTitelID	Journal of Neural Engineering	de_DE
dcterms.isPartOf.ZS-Issue	Article 036008	de_DE
dcterms.isPartOf.ZS-Volume	17	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE