Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering

dc.contributor.author	Hodas, Martin
dc.contributor.author	Hinderhofer, Alexander
dc.contributor.author	Schreiber, Frank
dc.date.accessioned	2020-12-14T10:13:14Z
dc.date.available	2020-12-14T10:13:14Z
dc.date.issued	2020
dc.identifier.issn	1528-7505
dc.identifier.uri	http://hdl.handle.net/10900/110604
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acs.cgd.0c00448	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	570	de_DE
dc.subject.ddc	600	de_DE
dc.subject.ddc	610	de_DE
dc.title	Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200929220116_00288
utue.publikation.seiten	5269-5276	de_DE
utue.personen.roh	Mrkyvkova, Nada
utue.personen.roh	Nadazdy, Peter
utue.personen.roh	Hodas, Martin
utue.personen.roh	Chai, Jianwei
utue.personen.roh	Wang, Shijie
utue.personen.roh	Chi, Dongzhi
utue.personen.roh	Sojkova, Michaela
utue.personen.roh	Hulman, Martin
utue.personen.roh	Chumakov, Andrei
utue.personen.roh	Konovalov, Oleg, V
utue.personen.roh	Hinderhofer, Alexander
utue.personen.roh	Jergel, Matej
utue.personen.roh	Majkova, Eva
utue.personen.roh	Siffalovic, Peter
utue.personen.roh	Schreiber, Frank
dcterms.isPartOf.ZSTitelID	Crystal Growth & Design	de_DE
dcterms.isPartOf.ZS-Issue	8	de_DE
dcterms.isPartOf.ZS-Volume	20	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE