Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering

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Simultaneous Monitoring of Molecular Thin Film Morphology and Crystal Structure by X-ray Scattering

Author: Mrkyvkova, Nada; Nadazdy, Peter; Hodas, Martin; Chai, Jianwei; Wang, Shijie; Chi, Dongzhi; Sojkova, Michaela; Hulman, Martin; Chumakov, Andrei; Konovalov, Oleg, V; Hinderhofer, Alexander; Jergel, Matej; Majkova, Eva; Siffalovic, Peter; Schreiber, Frank
Tübinger Autor(en):
Hodas, Martin
Hinderhofer, Alexander
Schreiber, Frank
Published in: Crystal Growth & Design (2020), Bd. 20, H. 8, S. 5269-5276
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acs.cgd.0c00448
ISSN: 1528-7505
DDC Classifikation: 540 - Chemistry and allied sciences
570 - Life sciences; biology
600 - Technology
610 - Medicine and health
Dokumentart: Article
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