Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

dc.contributor.author	Kobald, Arne
dc.contributor.author	Chen, Yu-Ting
dc.contributor.author	Meixner, Alfred J.
dc.contributor.author	Zhang, Dai
dc.contributor.author	Berg, Marius F.A. van den
dc.contributor.author	Horneber, Anke
dc.date.accessioned	2020-11-26T15:51:13Z
dc.date.available	2020-11-26T15:51:13Z
dc.date.issued	2020
dc.identifier.issn	2190-4286
dc.identifier.uri	http://hdl.handle.net/10900/109838
dc.language.iso	en	de_DE
dc.publisher	Beilstein - Institut	de_DE
dc.relation.uri	http://dx.doi.org/10.3762/bjnano.11.99	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200929220116_00446
utue.publikation.seiten	1147-1156	de_DE
utue.personen.roh	van den Berg, Marius
utue.personen.roh	Moeinian, Ardeshir
utue.personen.roh	Kobald, Arne
utue.personen.roh	Chen, Yu-Ting
utue.personen.roh	Horneber, Anke
utue.personen.roh	Strehle, Steffen
utue.personen.roh	Meixner, Alfred J.
utue.personen.roh	Zhang, Dai
dcterms.isPartOf.ZSTitelID	Beilstein Journal of Nanotechnology	de_DE
dcterms.isPartOf.ZS-Volume	11	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE