Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

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Revealing the local crystallinity of single silicon core-shell nanowires using tip-enhanced Raman spectroscopy

Author: van den Berg, Marius; Moeinian, Ardeshir; Kobald, Arne; Chen, Yu-Ting; Horneber, Anke; Strehle, Steffen; Meixner, Alfred J.; Zhang, Dai
Tübinger Autor(en):
Kobald, Arne
Chen, Yu-Ting
Meixner, Alfred J.
Zhang, Dai
Berg, Marius F.A. van den
Horneber, Anke Christine
Published in: Beilstein Journal of Nanotechnology (2020), Bd. 11, S. 1147-1156
Verlagsangabe: Beilstein - Institut
Language: English
Full text: http://dx.doi.org/10.3762/bjnano.11.99
ISSN: 2190-4286
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
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