Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials

dc.contributor.author	Weimar, Udo
dc.contributor.author	Barsan, Nicolae
dc.date.accessioned	2020-07-20T13:24:45Z
dc.date.available	2020-07-20T13:24:45Z
dc.date.issued	2019
dc.identifier.issn	2379-3694
dc.identifier.uri	http://hdl.handle.net/10900/103500
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/acssensors.9b00975	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200409032300_01523
utue.publikation.seiten	2228-2249	de_DE
utue.personen.roh	Degler, David
utue.personen.roh	Weimar, Udo
utue.personen.roh	Barsan, Nicolae
dcterms.isPartOf.ZSTitelID	Acs Sensors	de_DE
dcterms.isPartOf.ZS-Issue	9	de_DE
dcterms.isPartOf.ZS-Volume	4	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE