Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials

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dc.contributor.author Weimar, Udo
dc.contributor.author Barsan, Nicolae
dc.date.accessioned 2020-07-20T13:24:45Z
dc.date.available 2020-07-20T13:24:45Z
dc.date.issued 2019
dc.identifier.issn 2379-3694
dc.identifier.uri http://hdl.handle.net/10900/103500
dc.language.iso en de_DE
dc.publisher Amer Chemical Soc de_DE
dc.relation.uri http://dx.doi.org/10.1021/acssensors.9b00975 de_DE
dc.subject.ddc 540 de_DE
dc.subject.ddc 600 de_DE
dc.title Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials de_DE
dc.type Artikel de_DE
utue.quellen.id 20200409032300_01523
utue.publikation.seiten 2228-2249 de_DE
utue.personen.roh Degler, David
utue.personen.roh Weimar, Udo
utue.personen.roh Barsan, Nicolae
dcterms.isPartOf.ZSTitelID Acs Sensors de_DE
dcterms.isPartOf.ZS-Issue 9 de_DE
dcterms.isPartOf.ZS-Volume 4 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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