Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials

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Current Understanding of the Fundamental Mechanisms of Doped and Loaded Semiconducting Metal-Oxide-Based Gas Sensing Materials

Author: Degler, David; Weimar, Udo; Barsan, Nicolae
Tübinger Autor(en):
Weimar, Udo
Barsan, Nicolae
Published in: Acs Sensors (2019), Bd. 4, H. 9, S. 2228-2249
Verlagsangabe: Amer Chemical Soc
Language: English
Full text: http://dx.doi.org/10.1021/acssensors.9b00975
ISSN: 2379-3694
DDC Classifikation: 540 - Chemistry and allied sciences
600 - Technology
Dokumentart: Artikel
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