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| dc.contributor.author | Ferdinand, Benedikt | |
| dc.contributor.author | Kleiner, Reinhold | |
| dc.contributor.author | Kölle, Dieter | |
| dc.date.accessioned | 2020-07-16T14:45:32Z | |
| dc.date.available | 2020-07-16T14:45:32Z | |
| dc.date.issued | 2019 | |
| dc.identifier.issn | 1089-7623 | |
| dc.identifier.uri | http://hdl.handle.net/10900/103353 | |
| dc.language.iso | en | de_DE |
| dc.publisher | Amer Inst Physics | de_DE |
| dc.relation.uri | http://dx.doi.org/10.1063/1.5116904 | de_DE |
| dc.subject.ddc | 530 | de_DE |
| dc.subject.ddc | 600 | de_DE |
| dc.title | Characterizing dielectric properties of ultra-thin films using superconducting coplanar microwave resonators | de_DE |
| dc.type | Article | de_DE |
| utue.quellen.id | 20200409032300_00594 | |
| utue.personen.roh | Ebensperger, Nikolaj G. | |
| utue.personen.roh | Ferdinand, Benedikt | |
| utue.personen.roh | Koelle, Dieter | |
| utue.personen.roh | Kleiner, Reinhold | |
| utue.personen.roh | Dressel, Martin | |
| utue.personen.roh | Scheffler, Marc | |
| dcterms.isPartOf.ZSTitelID | Review of Scientific Instruments | de_DE |
| dcterms.isPartOf.ZS-Issue | Article 114701 | de_DE |
| dcterms.isPartOf.ZS-Volume | 90 | de_DE |
| utue.fakultaet | 07 Mathematisch-Naturwissenschaftliche Fakultät | de_DE |
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