Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

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dc.contributor.author Akata, Zeynep
dc.date.accessioned 2020-05-18T14:07:49Z
dc.date.available 2020-05-18T14:07:49Z
dc.date.issued 2019-07-19
dc.identifier.uri http://hdl.handle.net/10900/100758
dc.language.iso en de_DE
dc.relation.uri http://dx.doi.org/10.1109/TPAMI.2018.2857768 de_DE
dc.subject.ddc 004 de_DE
dc.title Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly de_DE
dc.type Artikel de_DE
utue.publikation.seiten 2251 - 2265 de_DE
utue.personen.roh Xian, Yongqin
utue.personen.roh Lampert, Christoph
utue.personen.roh Schiele, Bernt
utue.personen.roh Akata, Zeynep
dcterms.isPartOf.ZSTitelID IEEE Transactions on Pattern Analysis and Machine Intelligence de_DE
dcterms.isPartOf.ZS-Volume 41 de_DE


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