Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

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Zero-Shot Learning—A Comprehensive Evaluation of the Good, the Bad and the Ugly

Author: Xian, Yongqin; Lampert, Christoph; Schiele, Bernt; Akata, Zeynep
Tübinger Autor(en):
Akata, Zeynep
Published in: IEEE Transactions on Pattern Analysis and Machine Intelligence (2019-07-19), Bd. 41, S. 2251 - 2265
Language: English
Full text: http://dx.doi.org/10.1109/TPAMI.2018.2857768
DDC Classifikation: 004 - Data processing and computer science
Dokumentart: Article
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