dc.contributor.author |
Simmert, Steve |
|
dc.contributor.author |
Schäffer, Erik |
|
dc.date.accessioned |
2019-07-01T13:59:13Z |
|
dc.date.available |
2019-07-01T13:59:13Z |
|
dc.date.issued |
2018 |
|
dc.identifier.issn |
1365-2818 |
|
dc.identifier.uri |
http://hdl.handle.net/10900/89979 |
|
dc.language.iso |
en |
de_DE |
dc.publisher |
Wiley |
de_DE |
dc.relation.uri |
http://dx.doi.org/10.1111/jmi.12744 |
de_DE |
dc.subject.ddc |
570 |
de_DE |
dc.subject.ddc |
600 |
de_DE |
dc.title |
Label-free high-speed wide-field imaging of single microtubules using interference reflection microscopy |
de_DE |
dc.type |
Article |
de_DE |
utue.quellen.id |
20190321153956_00996 |
|
utue.publikation.seiten |
60-66 |
de_DE |
utue.personen.roh |
Mahamdeh, Mohammed |
|
utue.personen.roh |
Simmert, Steve |
|
utue.personen.roh |
Luchniak, Anna |
|
utue.personen.roh |
Schaeffer, Erik |
|
utue.personen.roh |
Howard, Jonathon |
|
dcterms.isPartOf.ZSTitelID |
Journal of Microscopy |
de_DE |
dcterms.isPartOf.ZS-Issue |
1 |
de_DE |
dcterms.isPartOf.ZS-Volume |
272 |
de_DE |
utue.fakultaet |
07 Mathematisch-Naturwissenschaftliche Fakultät |
de_DE |