Mission profile-based assessment of semiconductor technologies for automotive applications

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Mission profile-based assessment of semiconductor technologies for automotive applications

Author: Ahari, Ali; Viehl, Alexander; Bringmann, Oliver; Rosenstiel, Wolfgang
Tübinger Autor(en):
Ahari, Ali
Bringmann, Oliver
Rosenstiel, Wolfgang
Published in: Microelectronics Reliability (2018), Bd. 91, S. 129-138
Verlagsangabe: Pergamon - Elsevier Science Ltd
Language: English
Full text: http://dx.doi.org/10.1016/j.microrel.2018.08.008
ISSN: 0026-2714
DDC Classifikation: 600 - Technology
530 - Physics
Dokumentart: Artikel
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