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| Author: | Ahari, Ali; Viehl, Alexander; Bringmann, Oliver; Rosenstiel, Wolfgang | |
| Tübinger Autor(en): |
|
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| Published in: |
Microelectronics Reliability
(2018), Bd.
91,
S.
129-138 |
|
| Verlagsangabe: | Pergamon - Elsevier Science Ltd | |
| Language: | English | |
| Full text: | http://dx.doi.org/10.1016/j.microrel.2018.08.008 | |
| ISSN: | 0026-2714 | |
| DDC Classifikation: |
600 - Technology 530 - Physics |
|
| Dokumentart: | Article | |
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