PbSe mid-IR photoconductive thin films (part I): Phase analysis of the functional layer

dc.contributor.author	Kumar, Praveen
dc.contributor.author	Pfeffer, Michael Ulrich
dc.contributor.author	Schweda, Eberhard
dc.contributor.author	Eibl, Oliver
dc.date.accessioned	2019-04-09T07:34:01Z
dc.date.available	2019-04-09T07:34:01Z
dc.date.issued	2017
dc.identifier.issn	1873-4669
dc.identifier.uri	http://hdl.handle.net/10900/87595
dc.language.iso	en	de_DE
dc.publisher	Elsevier Science Sa	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.jallcom.2017.06.330	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	540	de_DE
dc.subject.ddc	600	de_DE
dc.title	PbSe mid-IR photoconductive thin films (part I): Phase analysis of the functional layer	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190131163842_00411
utue.publikation.seiten	316-326	de_DE
utue.personen.roh	Kumar, Praveen
utue.personen.roh	Pfeffer, Michael
utue.personen.roh	Schweda, Eberhard
utue.personen.roh	Eibl, Oliver
utue.personen.roh	Qiu, Jijun
utue.personen.roh	Shi, Zhisheng
dcterms.isPartOf.ZSTitelID	Journal of Alloys and Compounds	de_DE
dcterms.isPartOf.ZS-Volume	724	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE